http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017170068-A1

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filingDate 2015-12-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_746ea9fd3c21bb3a748aa98fc9912a51
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publicationDate 2017-06-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2017170068-A1
titleOfInvention Self-aligned low dielectric constant gate cap and a method of forming the same
abstract According to an embodiment of the present invention, self-aligned gate cap, comprises a gate located on a substrate; a gate cap surrounding a side of the gate; a contact region self-aligned to the gate; and a low dielectric constant oxide having a dielectric constant of less than 3.9 located on top of the gate. According to an embodiment of the present invention, a method of forming a self-aligned contact comprises removing at least a portion of an interlayer dielectric layer to expose a top surface of a gate cap located on a substrate; recessing the gate cap to form a recessed area; depositing a low dielectric constant oxide having a dielectric constant of less than 3.9 in the recessed area; and polishing a surface of the low dielectric constant oxide to expose a contact area.
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