http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2011248734-A1

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filingDate 2011-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2011-10-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2011248734-A1
titleOfInvention Electronic device test apparatus
abstract An electronic device test apparatus which can optimize throughput and costs is provided. n An electronic device test apparatus 1 comprises: a test cell cluster 10 having cell groups 11 A to 11 H each of which has a plurality of test cells 20 ; and a conveyor apparatus 30 supplying test carriers to a plurality of the test cells 20 , and each of the test cell 20 has: contactors 215 ; a flow path 221 connected to a vacuum pump 25 and reducing pressure in a recess 211 of a pocket 21 so as to bring external terminals 73 and the contactors 215 into contact; and a test circuit for running a test on an electronic circuit formed into a die 90.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2014009184-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2022011340-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2022011343-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2022011341-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11187721-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2020183804-A1
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Total number of triples: 31.