| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_2304e8417060cea10c40466801fed62c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6ca66be52f259700c253beef7da40671
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_22a098b86598ae8aa90061bcad33d296
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e5ea42766fa47d1375c1a0dc00ec5720 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C16-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C16-349
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C11-5642
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C11-5628 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-50004
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C16-0483
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-52 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
2005-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b1a2f62cbc0ef622817f54ded5b799ef
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_09ddf68e684506eff3a354395fb931b4
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aa13b42949b18d4b324a5d16aa869d83
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2e33f280d02f4ebce2ccb0a3f9c436bc |
| publicationDate |
2007-06-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
US-2007141731-A1 |
| titleOfInvention |
Semiconductor memory with redundant replacement for elements posing future operability concern |
| abstract |
Future operability predictor testing is incorporated into the fabrication of integrated circuits that utilize redundancy. Select reliability testing can be used to identify circuit elements such as memory cells that fail or become defective over time. Future operability tests and associated stress conditions are then developed for application during the fabrication process to identify memory cells that may pose a future operability concern before they actually fail. Memory cells that are determined to pose a future operability concern are replaced by redundant memory cells. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7995418-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2011248734-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7733720-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2012324298-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8749255-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8987076-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8694861-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9691875-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2017084341-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2011225438-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2008149733-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8604547-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2009172451-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9449718-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7616480-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2009132873-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7827018-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8208339-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-2669895-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2009129193-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I464741-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8411507-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2014295635-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2009132849-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7551508-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9438025-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7969778-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2017068467-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8284606-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-9442833-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7602647-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111028879-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7480179-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2005058335-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7630248-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2007166958-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10908838-B2 |
| priorityDate |
2005-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |