http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-2009130807-A1

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-8242
filingDate 2009-01-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9230bb18d444000459f0b3c9bff0567a
publicationDate 2009-05-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-2009130807-A1
titleOfInvention Trench DRAM Cell with Vertical Device and Buried Word Lines
abstract A DRAM array having trench capacitor cells of potentially 4F 2 surface area (F being the photolithographic minimum feature width), and a process for fabricating such an array. The array has a cross-point cell layout in which a memory cell is located at the intersection of each bit line and each word line. Each cell in the array has a vertical device such as a transistor, with the source, drain, and channel regions of the transistor being formed from epitaxially grown single crystal silicon. The vertical transistor is formed above the trench capacitor.
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