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filingDate 2021-06-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2022-12-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-11528811-B2
titleOfInvention Method, device and system for providing etched metallization structures
abstract Techniques and mechanisms for providing anisotropic etching of a metallization layer of a substrate. In an embodiment, the metallization layer includes grains of a conductor, wherein a first average grain size and a second average grain size correspond, respectively, to a first sub-layer and a second sub-layer of the metallization layer. The first sub-layer and the second sub-layer each span at least 5% of a thickness of the metallization layer. A difference between the first average grain size and the second average grain size is at least 10% of the first average grain size. In another embodiment, a first condition of metallization processing contributes to grains of the first sub-layer being relatively large, wherein an alternative condition of metallization processing contributes to grains of the second sub-layer being relatively small. A grain size gradient across a thickness of the metallization layer facilitates etching processes being anisotropic.
priorityDate 2017-09-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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