Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_fd446fb0d73aa96d044fea2eaa3c8ebc |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81C2201-0112 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B2203-0315 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81C2201-0132 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B2201-0264 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81C2203-035 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B2203-0127 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01L9-0045 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01L19-0076 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B7-0048 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81C1-00325 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B7-0061 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01L9-0042 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01L19-146 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B81C1-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B81B7-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01L19-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01L19-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01L9-00 |
filingDate |
2017-09-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2021-04-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_497d22d732489344265942eef80aa233 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_68607dc4270eee3f60799dd9002f9c49 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_23dd8df8c5546f1d930759566310eead http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_031f29e4089c4834e894580c379c65a1 |
publicationDate |
2021-04-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
US-10988377-B2 |
titleOfInvention |
Method for producing a stress-decoupled micromechanical pressure sensor |
abstract |
A method for producing a micromechanical pressure sensor. The method includes: providing a MEMS wafer having a silicon substrate and a first cavity developed therein underneath a sensor diaphragm; providing a second wafer; bonding the MEMS wafer to the second wafer; and exposing a sensor core from the rear side; a second cavity being formed in the process between the sensor core and the surface of the silicon substrate, and the second cavity being developed with the aid of an etching process which is carried out using etching parameters that are modified in a defined manner. |
priorityDate |
2016-10-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |