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filingDate 2019-10-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2021-02-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-10930779-B2
titleOfInvention Method of forming a vertical transistor pass gate device
abstract A semiconductor device including a fin structure present on a supporting substrate to provide a vertically orientated channel region. A first source/drain region having a first epitaxial material with a diamond shaped geometry is present at first end of the fin structure that is present on the supporting substrate. A second source/drain region having a second epitaxial material with said diamond shaped geometry that is present at the second end of the fin structure. A same geometry for the first and second epitaxial material of the first and second source/drain regions provides a symmetrical device.
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