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filingDate 2018-08-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2020-04-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c6516ff4731606efdd4e628b6a3412c7
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publicationDate 2020-04-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-10636893-B2
titleOfInvention Replacement metal gate with reduced shorting and uniform chamfering
abstract The present disclosure relates to semiconductor structures and, more particularly, to replacement metal gate structures with reduced shorting and uniform chamfering, and methods of manufacture. The structure includes: a long channel device composed of a conductive gate material with a capping layer over the conductive gate material and extending to sides of the conductive gate material; and a short channel device composed of the conductive gate material and the capping layer over the conductive gate material.
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