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filingDate 2016-07-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2018-09-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber US-10074563-B2
titleOfInvention Structure and formation method of interconnection structure of semiconductor device
abstract Structures and formation methods of a semiconductor device structure are provided. The semiconductor device structure includes a gate stack over a semiconductor substrate and a spacer element over a sidewall of the gate stack. The spacer element is substantially free of oxygen. The semiconductor device structure also includes a dielectric layer over the semiconductor substrate, and the dielectric layer surrounds the gate stack and the spacer element. The semiconductor device structure further includes a conductive contact penetrating through the dielectric layer and electrically connected to a conductive feature over the semiconductor substrate. An angle between a sidewall of the conductive contact and a top surface of the spacer element is in a range from about 90 degrees to about 120 degrees, and the conductive contact covers a portion of the spacer element.
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