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filingDate 2017-10-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2019-08-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_129173833d7e97174955f5104d0c14ba
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publicationDate 2019-08-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I669784-B
titleOfInvention Method of forming a contact plug
abstract A method of forming a contact plug includes forming an interlayer dielectric to cover a gate stack of a transistor, and the interlayer dielectric and the gate are stacked as part of a wafer. The interlayer dielectric is etched to form a contact opening, and the source / drain region of the transistor or the gate electrode in the gate stack is exposed through the contact opening. A conductive cap layer is formed to extend into the contact opening. Electrochemical plating is used to plate a metal-containing material on the conductive cap layer in the plating solution. The metal-containing material has a portion filled into the contact opening, and the sulfur content of the plating solution is less than about 100 ppm. The wafer is subjected to a planarization process to remove excess portions of the metal-containing material, and the remaining portion of the metal-containing material and the remaining portion of the conductive cap layer are combined to form a contact plug.
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