http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I253145-B

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filingDate 2004-12-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2006-04-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9ca8d6ea6c85e911240cba536f73744e
publicationDate 2006-04-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-I253145-B
titleOfInvention Semiconductor device manufacturing method
abstract A semiconductor device manufacturing method includes the steps of: forming first and second insulation films on a substrate provided with a first wiring; sequentially forming first to third mask layers on the second insulation film; forming a wiring groove pattern in the third mask layer; selectively processing the third mask layer, formed to project into the inside of the wiring groove pattern, into a tapered shape; forming a contact hole pattern in the second and first mask layer, and removing the tapered shape portions of the third mask layer; and forming wiring grooves in the second insulation film by etching using the third mask layer, and forming contact holes in the insulation film by etching and using the second and first mask layers.
priorityDate 2004-01-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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