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filingDate 1998-12-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2001-05-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-434647-B
titleOfInvention Semiconductor device manufacturing method
abstract In a semiconductor device manufacturing method, a gate insulating film is formed on a silicon substrate, a conductive film made of a conductive material is formed on an insulating film, an anti-reflection coating made of an organic material is formed on the conductive film, a photosensitive resist film is formed on the anti-reflection coating, a predetermined optical image on the photoresist film is developed by exposure to form a resist pattern, the anti-reflection coating is then selectively removed by dry etching using a plasma of a gas mixture containing oxygen gas, a reactive gas, and an inert gas, while using the photoresist pattern as a mask, thereby forming an anti-reflection pattern, and the conductive film is etched by using the resist pattern as a mask, thereby forming an electrode.
priorityDate 1997-12-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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