http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-406286-B

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filingDate 1999-02-11-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2000-09-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ab82d2fa67c0a1a0733250dd4d1dc7cc
publicationDate 2000-09-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-406286-B
titleOfInvention Method of manufacturing semiconductor device
abstract In a method of manufacturing a semiconductor device, in the first step, a lower interconnection is formed on a semiconductor substrate through a first interlevel insulating film. In the second step, a second interlevel insulating film is formed on the semiconductor substrate including the lower interconnection. In the third step, a through hole is formed in the second interlevel insulating film to reach the lower interconnection. In the fourth step, after the third step is ended, a surface of the lower interconnection including a side surface thereof exposed to a bottom portion of the through hole is etched without exposing the semiconductor substrate to the atmosphere. In the fifth step, a plug made of a conductive material is formed in the through hole. In the sixth step, an upper interconnection to be connected to the plug is formed on the second interlevel insulating film.
priorityDate 1998-02-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 25.