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publicationDate 2012-11-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber TW-201246359-A
titleOfInvention Dry chemical cleaning for gate stack preparation
abstract A deposition process including a dry etch process, followed by a deposition process of a high-k dielectric is disclosed. The dry etch process involves placing a substrate to be cleaned into a processing chamber to remove surface oxides. A gas mixture is energized to form a plasma of reactive gas which reacts with an oxide on the substrate, forming a thin film. The substrate is heated to vaporize the thin film and expose a substrate surface. The substrate surface is substantially free of oxides. Deposition is then used to form a layer on the substrate surface.
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