Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_985f1bf0df4204078e687f8417dc5871 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-324 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-67069 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-31116 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-3065 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-324 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-67 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3065 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-311 |
filingDate |
2017-08-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ca9ee52a99354fb6fc0bb44362248889 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_961fb0b52a310d4ad0e3d009aea1ac82 |
publicationDate |
2019-03-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
KR-20190021794-A |
titleOfInvention |
Substrate treating apparatus and substrate treating method |
abstract |
The present invention relates to a substrate processing apparatus and a substrate processing method. According to an embodiment of the present invention, there is provided a method of processing a substrate, comprising: selectively etching a silicon nitride film for polysilicon, supplying water vapor into a chamber provided with a substrate to form a vapor layer around the substrate; And an etching step of selectively etching the silicon nitride film by supplying a process gas containing fluorine into the chamber after the step of forming the water vapor layer. |
priorityDate |
2017-08-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |