http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20190021794-A

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filingDate 2017-08-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ca9ee52a99354fb6fc0bb44362248889
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publicationDate 2019-03-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20190021794-A
titleOfInvention Substrate treating apparatus and substrate treating method
abstract The present invention relates to a substrate processing apparatus and a substrate processing method. According to an embodiment of the present invention, there is provided a method of processing a substrate, comprising: selectively etching a silicon nitride film for polysilicon, supplying water vapor into a chamber provided with a substrate to form a vapor layer around the substrate; And an etching step of selectively etching the silicon nitride film by supplying a process gas containing fluorine into the chamber after the step of forming the water vapor layer.
priorityDate 2017-08-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 34.