http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20160136109-A

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filingDate 2015-05-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d9d07b28bd3ed73f4f077cc1e53dff17
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publicationDate 2016-11-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20160136109-A
titleOfInvention Tin oxynitride single crystal thin film and method for fabricating the same
abstract The present invention relates to a tin oxide thin film having a single crystal structure and transparency and high electrical conductivity characteristics through control of stoichiometry of anions and a method for producing the same, and a method for manufacturing the tin oxide single crystal thin film according to the present invention, , The SnO z N 1 -z (0.35 < z < 0.45) thin film is deposited on the substrate. During the sputtering process, the reaction chamber is maintained at a vacuum, and the target material is a Sn target or a SnO 2 target And the plasma reaction gas is any one of N 2 and NH 3 or a mixture thereof.
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