http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20080114068-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ae372ddaa494f2face39592b0429cc16
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S438-903
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02631
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-324
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02672
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02554
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-22
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02579
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-20
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-324
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-18
filingDate 2007-06-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_07f2a396109f54dedfcbfd1a20262dd4
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_61f7be1316bb8178811bdc98c008479d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8c1a889cb7c7717f7f82df20a149bbcb
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_352dbed74442848cdf6c604669cba6ad
publicationDate 2008-12-31-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20080114068-A
titleOfInvention Zinc oxide semiconductor and method for manufacturing same
abstract A method for forming a zinc oxide semiconductor and a zinc oxide semiconductor produced thereby are disclosed. A metal catalyst layer is introduced on the zinc oxide thin film having n-type electrical properties, and heat-treated to modify the zinc oxide thin film having p-type electrical properties. Through the heat treatment, hydrogen atoms present in the zinc oxide thin film are removed by the metal catalyst. Therefore, the hydrogen atoms in the thin film are removed by the metal catalyst and the heat treatment, and the concentration of the holes as carriers increases. That is, the n-type zinc oxide thin film is modified with a high concentration of p-type zinc oxide semiconductor.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20220076886-A
priorityDate 2007-06-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID123290
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419520343
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID947
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID977
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559192
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID104727
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419583196
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID458392451
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419556970
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID14806
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419523291

Total number of triples: 36.