http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20050031160-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c16d2144a81bfa32a665dca1e93c3d37
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N70-881
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N70-231
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10B63-30
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-8247
filingDate 2003-09-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0afab63476957ec7dc87085da32221d8
publicationDate 2005-04-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20050031160-A
titleOfInvention Phase-changable memory device and method of forming the same
abstract A phase conversion memory element and its formation method are disclosed. The phase change memory device includes a phase change element positioned on the lower electrode contact; A metal oxide layer on the phase change element and aligned with the phase change element; A conductive metal oxide layer disposed on the phase change element and having a sidewall contacting the metal oxide layer; and an upper electrode contact electrically connected to the phase change element. In order to form this element, a lower electrode contact is formed on the semiconductor substrate through the lower interlayer insulating film and electrically connected to the semiconductor substrate. A phase conversion element overlapping the lower electrode contact and covering a portion of the lower interlayer insulating layer and a metal oxide layer aligned with the phase conversion element are formed on the phase conversion element. An upper interlayer insulating film is laminated. The upper interlayer insulating layer is patterned to form an upper electrode contact hole exposing the metal oxide layer. A heat treatment process is performed on the semiconductor substrate on which the upper electrode contact hole is formed to deform the metal oxide film exposed by the upper electrode contact hole into a conductive metal oxide film. An upper electrode contact is formed to fill the upper electrode contact hole.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100842903-B1
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8148710-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8551805-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7803657-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7332370-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100721017-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8026125-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100668846-B1
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type http://data.epo.org/linked-data/def/patent/Publication

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