http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20040073775-A

Outgoing Links

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c16d2144a81bfa32a665dca1e93c3d37
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-31
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76837
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-31
filingDate 2003-02-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b66cdf73fa8a8389279d834e69855ada
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a7785db2231dc2cc5e2768c514d2ddea
publicationDate 2004-08-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-20040073775-A
titleOfInvention method of forming dielectric layer in semiconductor device
abstract A method of forming an HDP insulating film for insulating wirings having a high aspect ratio is disclosed. The method forms a first insulating film having a flat surface covering the patterns by providing a substrate on which the patterns are formed and then depositing a first insulating material on the substrate. Subsequently, an etch back process is performed on the first insulating layer to form a first insulating layer pattern in which the voids are opened. And depositing a second insulating material on the first insulating film pattern to bury the open voids and form a second insulating film covering the first insulating film pattern and the patterns. Therefore, the insulating film formed by the above method may form an insulating film not containing voids only by changing the deposition process conditions and the etching process.
priorityDate 2003-02-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419520437

Total number of triples: 16.