Predicate |
Object |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66621 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76883 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76846 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-66621 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76856 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76877 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76879 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-4846 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02057 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-28556 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-2855 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-53209 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-5329 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76843 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76814 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-205 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-324 |
filingDate |
2013-03-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2017-12-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate |
2017-12-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
KR-101808209-B1 |
titleOfInvention |
Method of enabling seamless cobalt gap-fill |
abstract |
Methods are provided for depositing a contact metal layer within contact structures of a semiconductor device. In one embodiment, a method is provided for depositing a contact metal layer to form a contact structure in a semiconductor device. The method includes performing a cyclic metal deposition process to deposit a contact metal layer on the substrate, and annealing the contact metal layer disposed on the substrate. The periodic metal deposition process includes exposing a substrate to a deposition precursor gas mixture to deposit a portion of the contact metal layer on the substrate, exposing a portion of the contact metal layer to a plasma treatment process, Exposing the substrate to a deposition precursor gas mixture until the contact metal layer is achieved, and repeating the step of exposing a portion of the contact metal layer to a plasma treatment process. |
priorityDate |
2012-03-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |