http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101510212-B1

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-786
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02F1-136
filingDate 2008-06-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2015-04-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2015-04-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-101510212-B1
titleOfInvention Method for manufacturing oxide semiconductor thin film transistor
abstract A method of manufacturing an oxide semiconductor thin film transistor using a transparent oxide semiconductor as a channel material is disclosed. A manufacturing method of an oxide semiconductor thin film transistor to be disclosed includes forming a protective film on a channel layer and then performing a heat treatment process at a temperature of 100 캜 or more for 1 hour or more.
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Total number of triples: 32.