http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100906307-B1

Outgoing Links

Predicate Object
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76873
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76807
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76879
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76843
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3205
filingDate 2002-11-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2009-07-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2009-07-07-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-100906307-B1
titleOfInvention Manufacturing Method of Semiconductor Device
abstract The present invention relates to a method for manufacturing a semiconductor device, which forms a buffer layer having a predetermined composition of two metals between a barrier metal layer and a main metal layer to enhance adhesion and to manufacture a semiconductor device that can prevent porosity by relieving thermal stress. Provide a method. n n n n Dual damascene structure, barrier layer, buffer layer, thermal stress
priorityDate 2002-11-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-970077199-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20020054641-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20020054662-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2001118929-A
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419583196
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID104727

Total number of triples: 19.