http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100828979-B1

Outgoing Links

Predicate Object
classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K2203-0597
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K2203-124
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K3-383
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K3-064
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23F1-18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23F1-34
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-32134
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K3-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C09K13-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K3-067
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C23F1-02
classificationIPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K3-38
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23F1-18
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23F1-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05K3-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3213
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C09K13-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23F1-34
filingDate 2005-03-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2008-05-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2008-05-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-100828979-B1
titleOfInvention Etch solution, etching method and printed wiring board
abstract The etching solution which added the high concentration triazole type compound which can form the film which has an etching inhibitory effect in the cupric chloride solution is proposed. In the process of circuit pattern formation by the etching process using this etching liquid, since an etching suppression film is selectively formed in a part of copper foil located below the edge of an etching resist, side etching of copper foil in the horizontal direction is performed from the edge of an etching resist. It can be effectively suppressed. Moreover, since nonuniform fine unevenness | corrugation is formed in the side wall of the circuit pattern formed by the etching process, adhesiveness with the resin insulating layer which coat | covers a circuit pattern improves.n n n n Etching solution, etching suppression coating, printed wiring board
priorityDate 2004-03-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20010110735-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20010085851-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H0766528-A
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID417430547
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559261
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID169042
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID174
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID498427
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID432876627
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23978
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID17883462
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID456653168
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID418354341
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID24014
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID412753460
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419546721
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID247
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID410564226
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID14767867
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID673
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID458397365
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419517430
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID410627549
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID415861834
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID8706
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419489259
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419525326
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID458393346
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID103023
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID6590
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID154420417
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419851834
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID3283
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID7501
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID421152083

Total number of triples: 61.