http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100559621-B1

Outgoing Links

Predicate Object
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-369
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A47C17-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-389
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-01
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-6803
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-7445
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-6891
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-7455
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-6826
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3065
filingDate 2003-02-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2006-03-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2006-03-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber KR-100559621-B1
titleOfInvention Etching method of dry etching equipment with unipolar electrostatic chuck
abstract The present invention relates to an etching method of a dry etching equipment having a unipolar electrostatic chuck, including a stable step, a breakthrough etch step, a main etch step and an over etch step, and cooling to a gap space between the electrostatic chuck and the semiconductor substrate. Injecting gas to suppress the temperature increase of the semiconductor substrate by the etching process, the pressure of the cooling gas is characterized in that the pressure difference between the stable step and the next step is set to 5 Torr or less, compared with the prior art By reducing the difference in the cooling gas pressure between the initial step and the next step of etching, there is an advantage of reducing the occurrence frequency of the error due to the cooling gas outflow and reducing the particle generation due to the cooling gas outflow error.n n n n Unipolar, Electrostatic Chuck, Dry Etch, Helium Spill, Particles, Stable Step
priorityDate 2003-02-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23987
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419577374

Total number of triples: 20.