Predicate |
Object |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-31116 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C09K13-08 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-32136 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-32137 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C09K13-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-3065 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C07C19-08 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3065 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C07C19-08 |
filingDate |
2014-03-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate |
2017-02-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
JP-WO2014136877-A1 |
titleOfInvention |
High purity 2-fluorobutane |
abstract |
The present invention provides a high-purity 2-fluorobutane having a purity of 99.9% by volume or more and a butene content of 1000 ppm by volume or less, and the high-purity 2-fluorobutane, This method is used as an etching gas. According to the present invention, high-purity 2-fluorobutane suitable as a plasma reaction gas for semiconductors is provided. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-111406083-A |
priorityDate |
2013-03-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |