http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-WO2006028238-A1
Outgoing Links
| Predicate | Object |
|---|---|
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R3-00 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0466 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0483 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2005-09-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationDate | 2008-05-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | JP-WO2006028238-A1 |
| titleOfInvention | Test carrier |
| abstract | A test carrier for carrying out an inspection by holding the semiconductor device in a bare chip state and electrically connecting to the inspection device, and having an elasticity provided at a position corresponding to the external electrode of the semiconductor device A pin, a first wiring layer electrically connected to the probe pin and formed on the base material, a metal protrusion formed at a portion where the probe pin contacts an external electrode of the semiconductor device, and formed on the surface of the metal protrusion The metal layer and the second wiring layer formed on the first wiring layer are separated, and the metal layer and the second wiring layer are separated. |
| priorityDate | 2004-09-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 19.