http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S63261835-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3205
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-302
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3065
filingDate 1987-04-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ba62a800dd9ec26820f62b96065a69fb
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_34120285f28a9ad89d73f34e3b2de7c9
publicationDate 1988-10-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-S63261835-A
titleOfInvention Formation of electrode and wiring
abstract PURPOSE: To reduce the deterioration of the interlayer insulating film by performing an patterning by a reactive ion etching (RIE) using a mixed gas of silicon tetrachloride, boron trichloride and oxygen, or trifluorobromomethane as a reaction gas, thereby shaping the cross section of the electrode or wiring into a trapezoid. n CONSTITUTION: A patterning by RIE is performed using a mixed gas of silicon tetrachloride and oxygen, a mixed gas of boron trichloride and oxygen, a mixed gas of silicon tetrachloride and boron trichloride and oxygen, a mixed gas of any one of the mixed gases and chlorine, or trifluorobromomethane as a reaction gas 4a. In RIE, the etching proceeds where the etching exceeds the deposition. With this, the cross-sectional shape of an electrode wiring 5a is made trapezoidal, whereby the deterioration of the interlayer insulating film can be reduced. n COPYRIGHT: (C)1988,JPO&Japio
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H07335634-A
priorityDate 1987-04-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 24.