http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S5760330-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_e5db580deca7130dbe51805c6c608b35
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-3122
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02282
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02348
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02351
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-0757
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02137
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-038
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-075
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-312
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-004
filingDate 1980-09-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a2d473c8a4e0ba840c88f6b73abdefae
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5d4f9e19aceaa45ace9a21e3f4a96bdd
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ee1994bca4e0ca670152b536e699a81d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_74ed8a29a70c6d89e4fbec4bbdb6fd8c
publicationDate 1982-04-12-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-S5760330-A
titleOfInvention Resin composition
abstract PURPOSE: To obtain a resin composition which is superior in insulation characteristics and heat resistance and can be used as an insulation layer as it is after it is used as a material to be etched in a lightographic process by containing polyorganosilsesquioxane. n CONSTITUTION: 5W40vol. polyorganosilsequioxane (e.g.; polymethylsilsesquioxane) is dissolved in a solvent such as methyl isobutyl ketone, whereby a resin composition is obtained. Next, this composition is spin coated on a silicon semiconductor substrate and is prebaked in an inert gaseous atmosphere. After it is irradiated with electron beams by using a mask having line space patterns of about 2μm, it is developed by using a solvent such as xylene, whereby a resist layer is formed. When the vapor deposition of electrode metal or the like is carried out by using such composition, the danger of disconnection is less, and the semiconductor device of high reliability is obtained. n COPYRIGHT: (C)1982,JPO&Japio
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H0221575-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S61201430-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H0237694-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H0414782-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S6129153-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S60254036-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H0578939-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S60117242-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S62502071-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S60254132-A
priorityDate 1980-09-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID411746874
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419486329
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID7237
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID7909
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID226405837
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID419559541
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123

Total number of triples: 39.