http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S5629347-A

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Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_44f82521bd7b49adba4be2e3e4f3b66a
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3213
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3065
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-302
filingDate 1979-08-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_cde3fae3646712ae98968653f5c492f5
publicationDate 1981-03-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-S5629347-A
titleOfInvention Manufacture of semiconductor device
abstract PURPOSE:To completely retain a protective film under an electrode metal and to obtain a miniature electrode pattern in high reliability by forming a resist mask except the electrode pattern thereon and dry etching the electrode metal thereon. CONSTITUTION:An N type epitaxial layer 2 is formed on an N type Si substrate 1, an opening is perforated at an SiO2 film 4, and B is diffused to form a P<+> type layer 3 thereon. The surface is oxidized, P is then diffused to form a PSG film 5 thereon, and an opening is perforated at the layer 3. Then, a resist mask 6 is coated thereon, aluminum film 7 if evaporated thereon to form a resist mask 8 thereon, and the aluminum is plasma etched with CCl4. With the resist 6 as a stop per the PSG5 is completely retained. The masks 6, 8 are removed, are heat treated in N2, to complete the contact therebetween. This configuration does not almost sidewisely etch the aluminum 7 to form a miniature electrode pattern and to com pletely retain the PSG film 5 thereon so as to enhance the reliability.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S61220430-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H0527965-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H0114709-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S5884447-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-S58111201-A
priorityDate 1979-08-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 22.