Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_358a329cc314c43da9d13d9d90a7db83 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C23F4-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3065 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-302 |
filingDate |
1996-04-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_78e9c0cffb81de675395a2f4e9f1d85c http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2bd243cfae1aa2dc57c7060f14db0186 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4e7ddf78a4ea6060f49bd8b6cfac96af |
publicationDate |
1997-11-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
JP-H09289199-A |
titleOfInvention |
Plasma etching electrode |
abstract |
(57) Abstract: To obtain a plasma etching electrode which significantly reduces the generation of dust. SOLUTION: In a plasma etching electrode (1) formed with a large number of minute through holes (2) for passing a reaction gas, the peripheral edge portion on the surface side of the through holes is 0.01 to 0.5. The R side surface (3) having a diameter of 0.3 mm and the rear surface side peripheral edge portion having an R surface (4) of 0.3 mm or less are formed. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-100602824-B1 |
priorityDate |
1996-04-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |