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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3065
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11B5-39
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filingDate 1996-01-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_19ab67dff5ab20b95f020a82eef8efa6
publicationDate 1997-08-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H09205078-A
titleOfInvention Dry etching method
abstract (57) [Abstract] [Problem] It is possible to secure a selective ratio with a mask material, (EN) A dry etching method in which a material to be etched does not redeposit, and etching progresses rapidly so that a resist mask can sufficiently withstand. A Ni-based metal thin film is plasma-etched in an atmosphere containing a compound having a carbonyl group or a carboxyl group in the molecule. Here, the Ni-based metal thin film is a Ni thin film, and is also a Ni—Fe alloy thin film.
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type http://data.epo.org/linked-data/def/patent/Publication

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