http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H08203892-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0950e9df7f0e1b73efee1bda859951ad
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-31
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3205
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-316
filingDate 1995-01-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_192e16818c6d0a4a37e6fe84bd8b94bf
publicationDate 1996-08-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H08203892-A
titleOfInvention Semiconductor device manufacturing method and semiconductor manufacturing device
abstract (57) [Abstract] [Purpose] The relative dielectric constant of the reflow insulating film obtained when the reflow insulating film forming technology is adopted in the interlayer insulating film forming process in the multi-layer wiring process of the semiconductor device is high, and the flatness is excellent. It is possible to realize the interlayer insulating film at low cost without performing the flattening process. [Constitution] SiH 4 gas, H 2 O 2 and a fluorine-based gas in a radical state passed through a microwave waveguide 27 are introduced into a reaction chamber 20 accommodating a semiconductor substrate 30 on which an insulating film 33 has been formed, and 665 Pa In the following vacuum, -10 ℃ or more +1 It is characterized in that SiH 4 gas, H 2 O 2 and a fluorine-based gas are reacted with each other within a temperature range of 0 ° C. or less to form a reflow SiO 2 film 34 having a reflow shape on a semiconductor substrate.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6933568-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5981373-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-03097897-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-1319125-C
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7902549-B2
priorityDate 1995-01-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 20.