http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H06275640-A

Outgoing Links

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-786
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-336
filingDate 1993-03-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_06c2a67fb99e7382117013c02604c37c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0f128d9c2440afff71001e59f763b9ed
publicationDate 1994-09-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-H06275640-A
titleOfInvention Thin film transistor and manufacturing method thereof
abstract (57) [Summary] [Object] To provide a crystalline silicon thin film transistor (TFT) having an LDD (lightly doped drain) structure and excellent characteristics, and a method for manufacturing such a TFT. [Structure] A gate insulating film and a gate electrode are formed in an island-shaped semiconductor region, and impurities are injected in a self-aligned manner to form an LDD. Furthermore, after anodizing the gate electrode, Impurities are introduced to form impurity regions (source and drain). After that, a part or all of the anodic oxide on the island-shaped semiconductor region is removed to expose the LDD region, and a laser or strong light equivalent thereto is irradiated to activate the impurity region (including LDD). To do.
priorityDate 1993-03-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 18.