http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-5454727-B1

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filingDate 2013-07-10-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2014-03-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2014-03-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-5454727-B1
titleOfInvention Method for manufacturing thin film transistor
abstract PROBLEM TO BE SOLVED: To prevent an excessive temperature rise of a film constituting a thin film transistor at the time of excimer laser light irradiation in a self-alignment process. A diffusion prevention film is formed on a substrate that transmits an excimer laser beam, a gate electrode and a gate insulating film are formed thereon, and an oxide semiconductor layer is formed thereon. The structure 14a is irradiated with excimer laser light 16 from the substrate 2 side, and the gate electrode 6 is used as a mask, and the excimer laser is applied to regions outside the region corresponding to the gate electrode 6 of the oxide semiconductor layer 10. The resistance is reduced by irradiating light 16, and one of the outer regions is a source region 18 and the other is a drain region 19. The diffusion preventing film 4 is composed of a fluorinated silicon nitride film (SiN: F) containing fluorine in the silicon nitride film. [Selection] Figure 2
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Total number of triples: 29.