http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2015032792-A

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assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_669c01133740c5233f2c8738904ea3af
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-027
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B29C59-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B29C33-74
filingDate 2013-08-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8eae72ac74d25d1dbf6bebb7f86c6165
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_88131e378b5e15ed057830cbf219b769
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publicationDate 2015-02-16-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2015032792-A
titleOfInvention Template imperfection correction method, inspection method, and manufacturing method for nanoimprint lithography
abstract An NIL template defect correction method, inspection method, and manufacturing method capable of detecting minute black defects are provided. A defect correction method for a template for NIL, wherein a first template preparation step for preparing a first template and an inspection template for producing an inspection template by imprint transfer using the first template are provided. A template preparation step, an inspection template inspection step for inspecting a white defect portion of the inspection template, and the first template in which the white defect portion is transferred when the white defect portion is detected in the inspection template. A first template defect confirming step for confirming the black defect portion, and a first template defect correcting step for correcting the black defect portion when the black defect portion is detected in the first template. Template defect correction method. [Selection] Figure 1
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2016149506-A
priorityDate 2013-08-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 26.