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filingDate 2011-12-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2014-02-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2014503999-A
titleOfInvention Selective seed layer processing for feature plating
abstract Conventional metallization processes do not work for high density or small feature size patterns. For example, a dry film can collapse or lift off during patterning, causing a short circuit or opening in the metallization pattern. An exemplary method for integrated circuit metallization includes forming features such as trenches, pads, and faces in a dielectric layer, and depositing a seed layer in the desired features in the dielectric layer; Selectively processing the seed layer. The treated region in the seed layer can be used as a seed for electroless deposition of a conductive material, such as copper, into the feature. If the seed layer is a catalyst ink, the seed layer can be processed by curing the catalyst ink with a laser.
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