Predicate |
Object |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S430-146 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S430-114 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-0392 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03F7-039 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C08F220-283 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C08F220-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C08F220-22 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C08F220-281 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-38 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C08F220-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03F7-039 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-027 |
filingDate |
2010-01-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate |
2012-08-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
JP-2012518692-A |
titleOfInvention |
Bake photoresist material after ultra low temperature exposure |
abstract |
PROBLEM TO BE SOLVED: To provide an improved chemically amplified photoresist material and composition. The present invention relates to a first methacrylate monomer having a pendant spacer between a polymer backbone and an acid sensitive group, a second methacrylate monomer having a pendant group containing a fluorinated alkyl group, and a pendant hydrocarbon group. And a third methacrylate monomer having: The photoresist formulation includes the polymer, a photoacid generator, and a casting solvent. A method of forming a patterned photoresist film from a photoresist formulation is characterized by a post-exposure bake at a temperature of about 60 ° C. or less. [Selection] Figure 1 |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2019054311-A1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11687001-B2 |
priorityDate |
2009-02-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |