http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010087006-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3065
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C30B33-12
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filingDate 2008-09-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a1266a79114c18ac615b8d259a6f7a3d
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publicationDate 2010-04-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2010087006-A
titleOfInvention Plasma processing apparatus and plasma processing method
abstract Provided are a plasma processing apparatus and a plasma processing method capable of mirror-processing a silicon substrate without deteriorating the surface roughness of the silicon material when hydrogen gas is used as an etching gas. A plasma processing apparatus (10) is configured to bring a hydrogen plasma (6) generated between an electrode (11) close to a silicon substrate (2) in a hydrogen atmosphere and the silicon substrate (2) into contact with the surface of the silicon substrate (2). The substrate 2 is etched. A microwave oscillator 23 that outputs a microwave for generating the hydrogen plasma 6, and a hydrogen introduction line 12 that supplies hydrogen gas into the plasma through a pipe that forms the electrode 11 toward the processing surface of the silicon substrate 2. Prepare. The silicon substrate 2 is etched at an etching rate equal to or higher than the diffusion rate of hydrogen into the silicon substrate 2. [Selection] Figure 1
priorityDate 2008-09-29-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 25.