http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009152304-A

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filingDate 2007-12-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_06a14aed8aac19bee97aeb122c11f235
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publicationDate 2009-07-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2009152304-A
titleOfInvention Plasma processing equipment
abstract An object of the present invention is to provide a plasma processing apparatus for measuring the etching amount of a material to be processed by light interference on the surface of a sample to be processed and determining the etching end point. The processing accuracy can be improved by accurate etching amount detection. A detector for detecting light from a surface of a sample to be processed through a shower plate in a plasma processing apparatus that generates plasma between the shower plate and a lower electrode to process the sample to be processed is light to which light is input. A light introduction unit comprising a transmission body and a spectroscope for analyzing the light obtained by the light introduction unit, and an end surface to which light from the light introduction unit is input is connected to the inside of the vacuum vessel from the end surface on the plasma side of the shower plate. Are arranged at a distance more than 5 times the mean free path of gas molecules. [Selection] Figure 1
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http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-20190025772-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2012049299-A
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priorityDate 2007-12-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 32.