http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2008306215-A

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filingDate 2008-09-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_77fefe8c82978c4872ed4b536b18361f
publicationDate 2008-12-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2008306215-A
titleOfInvention Chuck for probe station
abstract PROBLEM TO BE SOLVED: To provide a chuck in which an upper chuck assembly element supporting a wafer does not lose flatness when a probe is added to the wafer. The chuck includes an upper chuck assembly element 180 having an upper surface 198 adapted to support a wafer, and further between the upper chuck assembly element and a central chuck assembly element 182 below it. A chuck separation device having three independent pins 200, 202, 204 defining a spacing and connected to the upper chuck assembly element 180. The chuck separation device has an insulating U-shaped member 246 having a first surface that presses and engages the upper surface 224 of the central chuck assembly element and a second surface that presses and engages the first surface of the conductive U-shaped member 244. . The second surface of the conductive U-shaped member 244 is pressed against the lower surface of the upper chuck assembly element. The thickness of the first surface of the insulating U-shaped member is less than 1/3 of the thickness of the conductive U-shaped member. [Selection] Figure 13
priorityDate 2000-09-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 26.