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publicationDate 2008-06-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2008147675-A
titleOfInvention Method for forming electrical connection structure using non-uniform metal nitride film and connection structure manufactured by this method
abstract A method for forming an electrical connection structure of an integrated circuit element is provided. A first insulating layer is formed on a semiconductor substrate, and an opening is formed in the first insulating layer. The sidewall of the opening is lined with a first metal nitride layer 312 having a non-uniform nitrogen concentration. A conductive pattern 410 is formed inside the opening. A second metal nitride film 320 is formed between the conductive pattern and the first nitrided metal layer. [Selection] Figure 10
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