http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2006303424-A

Outgoing Links

Predicate Object
assignee http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b1007735376d07808ebe297f823b2829
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-1214
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L29-78621
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-1288
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-336
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-786
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02F1-1368
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-77
filingDate 2005-12-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_45499c043ca92aa610fd710076ffd6e2
publicationDate 2006-11-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2006303424-A
titleOfInvention Method for manufacturing thin film transistor of liquid crystal display device
abstract A method of manufacturing a thin film transistor for a liquid crystal display device with high cost competitiveness by reducing the number of masks to be applied is provided. A step of forming a semiconductor layer over the entire surface of a substrate on which a first element constituting a pixel portion and a second element and a third element constituting a drive circuit portion are formed, and a source and drain region of the semiconductor layer of the third element Doping a first conductive type impurity into the semiconductor layer of the first and second elements, doping a second conductive type impurity into the semiconductor layer of the first and second elements, forming a conductive layer over the entire substrate, and forming a conductive layer and a semiconductor layer below the conductive layer Forming the source, drain, and active region of the first, second, and third elements by simultaneous patterning, forming the gate insulating film on the entire substrate, and the first, second, and third elements on the gate insulating film Forming a gate electrode, forming a protective film on the entire substrate, forming a drain contact hole exposing the drain in the protective film, and draining the protective film through the drain contact hole. Comprising forming a pixel electrode connected to. [Selection] Figure 2E
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2010177668-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-101794049-A
priorityDate 2005-04-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

Predicate Subject
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H0697441-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H05275447-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2001013524-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2002151381-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2000036601-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-H10221717-A
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID69667
http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID425270609

Total number of triples: 26.