http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2001172473-A

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classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-31
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filingDate 1999-10-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1b8d50fff6826f2fbadc5d0e0eb5f824
publicationDate 2001-06-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2001172473-A
titleOfInvention Epoxy resin composition for semiconductor encapsulation and semiconductor device using the same
abstract [PROBLEMS] To provide an epoxy resin composition for semiconductor encapsulation in which the relative dielectric constant corresponding to the increase in the frequency and the gelation time are short in a situation where the frequency of the semiconductor element is increasing. . The epoxy resin composition for semiconductor encapsulation contains the following components (A) to (E) as essential components. Then, the hydroxyl group of the component (B) is adjusted to 1.02 to 1.20 equivalents with respect to 1 equivalent of the epoxy group of the component (A), and the (C) is adjusted to 1 equivalent of the epoxy group of the component (A). ) The cyanate ester group of the component is set to an equivalent ratio of 0.10 to 1.00 equivalent. (A) Epoxy resin. (B) a phenolic resin. (C) Polyvalent cyanate ester compound. (D) a curing accelerator. (E) an inorganic filler.
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