http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2000277499-A

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filingDate 2000-03-03-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_21747acfb77b0d181ab4dff0d66658d4
publicationDate 2000-10-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2000277499-A
titleOfInvention Patterning method
abstract PROBLEM TO BE SOLVED: To selectively etch a carbon film having high chemical resistance and high hardness, and to apply the film industrially. SOLUTION: A carbon film is formed on a material to be patterned, and the carbon film is patterned by an oxygen gas. The material to be patterned is patterned into the same pattern as the patterned carbon film.
priorityDate 1988-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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