http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2000012411-A

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filingDate 1999-05-25-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a774bccd60c85665a2339c5f9fc6cd1c
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publicationDate 2000-01-14-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber JP-2000012411-A
titleOfInvention Ultra-flat silicon semiconductor wafer and method of manufacturing semiconductor wafer
abstract (57) Abstract: An ultra-flat silicon wafer used in the semiconductor industry for producing electronic components having a line width of 0.13 μm or less. SOLUTION: The following series of process steps which influence the flatness of the semiconductor wafer: a) a step of cutting the semiconductor wafer from a crystal; b) a step of flattening the semiconductor wafer by a grinding process step; c) an erosion type Etching, that is, removing damaged crystal regions near the surface by utilizing a plasma assisted etching process; d) performing plasma assisted etching with local resolution; and e) polishing the semiconductor wafer without stripes. The method of having. GBIR up to 0.2 μm and 0.13 up to A silicon semiconductor wafer having a flatness expressed as SFQR max of μm is prepared.
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-7028353-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-101591803-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2022224637-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-7582221-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2009289925-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-4863409-B2
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Total number of triples: 30.