Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ae372ddaa494f2face39592b0429cc16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_526cb931f1382d6e016ee651d55e1365 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02164 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02238 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-02255 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-31 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-31 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-316 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-314 |
filingDate |
1999-09-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f9458b105dc732bd4e53c6dd1ad8db98 |
publicationDate |
2000-04-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
GB-2342226-A |
titleOfInvention |
Growing a deuterium containing insulation layer |
abstract |
An oxide or oxynitride layer is grown on a silicon substrate in a deuterium containing atmosphere in a furnace. The insulation layer may be grown in a deuterium oxide atmosphere. The layer may have a multilayer structure with a conventional insulating layer either overlying or underlying the deuterium oxide/oxynitride layer. The atmosphere in the furnace may be purely deuterium oxide or have a conventional oxidising gas component (ie oxygen, nitrogen monoxide or nitrogen dioxide). The leakage and breakdown characteristics of the insulation film are improved due to the formation of strong silicon-deuterium bonds. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107154354-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102016114940-B4 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-107154354-B |
priorityDate |
1998-09-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |