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filingDate 1999-09-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f9458b105dc732bd4e53c6dd1ad8db98
publicationDate 2000-04-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber GB-2342226-A
titleOfInvention Growing a deuterium containing insulation layer
abstract An oxide or oxynitride layer is grown on a silicon substrate in a deuterium containing atmosphere in a furnace. The insulation layer may be grown in a deuterium oxide atmosphere. The layer may have a multilayer structure with a conventional insulating layer either overlying or underlying the deuterium oxide/oxynitride layer. The atmosphere in the furnace may be purely deuterium oxide or have a conventional oxidising gas component (ie oxygen, nitrogen monoxide or nitrogen dioxide). The leakage and breakdown characteristics of the insulation film are improved due to the formation of strong silicon-deuterium bonds.
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priorityDate 1998-09-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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