| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_b66df65a3193031a38086188f968b0b1 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07307 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-067 |
| filingDate |
1992-02-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2a7af24631f4607a13b3a3612b5b3051 |
| publicationDate |
1993-08-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
GB-2263980-A |
| titleOfInvention |
Testing integrated circuit dies |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-2298049-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-2297624-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/GB-2297624-A |
| priorityDate |
1992-02-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |