Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_040ec81c891acc3f3186f56cb99cf161 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-14 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-28176 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2644 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L29-78 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-58 |
filingDate |
1988-05-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e15c9ab4527f1264e820953b83d0a8ff |
publicationDate |
1988-12-07-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
EP-0294259-A2 |
titleOfInvention |
Screening of gate oxides on semiconductors |
abstract |
Testing of the gate oxides (14A) of all the transistors of a single die in a silicon wafer to be diced into a plurality of dice in a single operation is effected at an intermediate stage of the fabrication process by providing a metal layer (20) contacting selectively each of the gate electrodes (16) of a die at an intermediate stage of the processing and providing between the layer (20) and the wafer a voltage (22) of amplitude (V s ) insufficient to cause significant tunneling current through good gate oxides but sufficient to cause significant tunneling current through defective gate oxides. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-5850149-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-03034482-A3 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-03034482-A2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-19653177-C2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-19653177-A1 |
priorityDate |
1987-05-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |