Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_36333273e27f0db23ddddbf80ba79ba7 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823475 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-088 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-5226 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823871 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-0924 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-0886 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823821 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-088 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-092 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823475 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76805 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-823431 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-485 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76883 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76879 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-528 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768 |
filingDate |
2020-08-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4526195978869b078587b002746f4994 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_573aeecd7b98dbd4de4ad04458798264 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_701816bed27037a30a99ee9bd9416a20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bc92f76ae717916c7ab22d2e5d0f5bc7 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e0015d05abb0ac60cc3d8d838c74b0e6 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d5f9fec88b04bbc4f55de18f445c6dbe http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e2cc5a6358c837874cb5387a2730f5ba http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_28289288b45d7fdfada2e624f126ae5a http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_51fd586b4e2c7df058fe0fc07c6de169 |
publicationDate |
2021-04-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
DE-102020121496-A1 |
titleOfInvention |
DIFFERENT THROUGH CONTACT CONFIGURATIONS FOR DIFFERENT THROUGH CONTACT AREA REQUIREMENTS |
abstract |
Vias are disclosed along with methods for fabricating vias that have lower capacitance and resistance. An exemplary interconnect structure includes first and second source-drain contacts arranged in a dielectric layer. The first source-drain contact is in physical contact with a first source-drain element and the second source-drain contact is in physical contact with a second source-drain element. A first via with a first via layer configuration, a second via with a second via layer configuration and a third via with a third via layer configuration are arranged in the dielectric layer. The first and second vias extend into the first and second source-drain contacts, respectively, and are in physical contact therewith. A first thickness of the first via corresponds to a second thickness of the second via. The third via is in physical contact with a gate structure disposed between the first and second source-drain contacts. |
priorityDate |
2019-09-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |