http://rdf.ncbi.nlm.nih.gov/pubchem/patent/DE-102004047023-A1

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filingDate 2004-09-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bc385b76fd6a6c28ec53410f5de85d6f
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publicationDate 2006-04-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber DE-102004047023-A1
titleOfInvention Dielectric interlayer capacitor structure, method of fabricating the capacitor structure, and use of the capacitor structure
abstract ThenThe invention relates to a capacitor structure (1) with one on onenSubstrate (3) arranged lower electrode layer (5), an uppernElectrode layer (6) and one between the electrode layersnarranged, crystalline dielectric layer with zinc oxide (2).nThe capacitor structure is characterized in that betweennthe lower electrode layer and the crystalline dielectricnLayer with zinc oxide an amorphous dielectric interlayern(4) is arranged. In addition, there is also a method for manufacturingnthe capacitor structure according to one of the preceding claims withnthe process steps indicated: a) providing the substrate,nb) producing the lower electrode layer on a substrate surface of thenSubstrate, c) producing the amorphous intermediate layer on the lower onenElectrode layer, d) generating the crystalline dielectric layernwith zinc oxide on the intermediate layer and e) generating the upper onenElectrode layer on the crystalline dielectric layer withnZinc oxide. Through the amorphous dielectric layer can during thenDepositing the zinc oxide can be generated an electric field, thenacross fromna surface normalnthe substrate surfacenor the lower electrode layer is tilted. This will grow thenZinc oxide single crystals tilted up. The result is a crystallinendielectric layer, which are excited to shear thickness vibrationsncan. The capacitor structure is used as piezoacousticnResonator ...
priorityDate 2004-09-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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